JEOL JSM-6300F Field Emission SEM

JEOL JSM-6300F Field Emission SEM

Price available on request

The JEOL6300F SEM uses a field emission gun with cold cathode. The resolution is 1.5 nm in secondary electron imaging (SEI) and 3.0 nm in backscattered electron imaging (BEI) at 30 kV. The airlock specimen chamber allows up to a 32 mm diameter sample, and the size can also be up to 150 mm without the airlock.

Type Resolution Sample Options
CFE 1.5 nm @ 30 kV 5” max., 50 mm X 70 mm Y X-SIS
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